La description

Key Features & SpecificationsFeatures
  • Fully compliant to the 3GPP standard
  • One-button, standards-based measurements with pass/fail tests
  • Superior measurement speed for wireless device manufacturing with multiple measurements from a single acquisition using the uplink EXM sequencer
  • Superior measurement speed for femtocell manufacturing with multiple measurements from a single acquisition using the EXF downlink sequencer
GSM/EDGE/EDGE Evo measurements
  • EXM for wireless user equipment (UE) test: EVM, phase and frequency error, ORFS, PvT, TX band spur and more
  • EXF for femtocell test: EVM, phase and frequency error, output RF spectrum (ORFS) for single carrier, multi-carrier and VAMOS enabled BTS, power vs. time (PvT), intermodulation products, TX band spur and more
  • Multi-Carrier BTS (MCBTS) and adaptive QPSK (AQPSK) modulated VAMOS1 measurements per 3GPP TS 45 standard
Access features
  • License key upgradeable
  • Fixed and transportable licenses available
  • SCPI remote user interface
DescriptionThe GSM/EDGE/Evo measurement application helps you easily achieve your manufacturing test goals for today&rsquo,s multi-format devices or femtocells. It quickly performs standards-based measurements for compliance with the 3GPP standard. The EXM and EXF&rsquo,s flexible sequencer uses single acquisition multiple measurement (SAMM) techniques to provide high-speed calibration and verification of your devices, modules or femtocells for maximum manufacturing throughput. Should issues arise, multiple color-coded result views help you quickly identify them for quick resolution. Using the GSM/EDGE/Evo measurement application with the EXM or EXF wireless test set makes it easy to rapidly ramp up and optimize full-volume manufacturing.''